WTW 2006 - Call for Participation

CALL FOR PARTICIPATION

Dear Colleague --

The Advanced technical program for the Wireless Test Workshop is shown below. The WTW 2006 workshop will be held on April 30th, Claremont Resort, Berkeley, CA in conjunction with VLSI Test Symposium 2006.

The registration for the Wireless Test Workshop and hotel reservation is open. The details how to register is posted in the Workshop web site:

http://www.wtw2006.tec.ufl.edu/

WTW 2006 Advance Program Sunday, April 30, 2006, Claremont Resort, Berkeley, California
8:30am - 8:45am	Opening address Session I: Invited Speaker & System Level Test Chair: TBD
8:45am - 9:30am	Invited Speaker: *“RF Test In An OPENSTART Platform”* Rochit Rajusman, Advantest America
9:30am - 10:00am	*“Fault Model Based RF Testing, Moving from Functional to Analytical Testing”* Mark Roos, Roos Instruments
10:00am - 10:30am: Break
10:30am - 12:00pm	Session II: MIMO Testing Chair: TBD
10:30am - 11:30am	Mini Tutorial: “MIMO Technology and it Implementation in WLAN Systems: Operation and Testing” Gennady Farber, Agilent
11:30am - 12:00am	“Impact of Tester Architecture to Low Test Cost Quad Site True Parallel Test of a WLAN Front End Device“ Friedrich Taenzler, James Wang and Shirley Tsay, Texas Instruments
12:00pm - 1:00pm: Lunch
1:00pm - 2:30pm	Session III: DFT for RF devices Chair: TBD
1:00pm - 1:30pm	“Broadband Embedded Substrate Noise Measurement for RF/Microwave ICs” Ming He, William R. Eisenstadt and Robert M. Fox, University of Florida
1:30pm - 2:00pm	“RF Design and Testing: A Challenge in Manufacturing” Salem Abdennadher, Intel
2:00pm - 2:30pm	“A Low Cost Test Methodology Incorporating an RF Loopback Test Capability” Paul Berndt, Jung Kim, Mike Amundson and Brent Jensen, Cypress Semiconductor
2:30pm - 3:00pm: Break
3:00pm - 4:00pm	Session IV: Yield learning and Analysis for RF devices Chair: TBD
3:00pm - 3:30pm	“Yield Prediction and Enhancement for RF Circuits” Dale A Pollek, ChipMD Inc.
3:30pm - 4:00pm	“Yield Analysis for RF ICs” Gaurav Verma and Dennis Fuoss, Qualcomm
4:00pm - 5:30pm	Session V: Test Techniques and Standards Chair: TBD
4:00pm - 4:30pm	“Accurately Measure Phase-Locked Loop (PLL) Lock Ttime in Production” Larry Zhang, Texas instruments
4:30pm - 5:00pm	“STIL-AMS : “A new challenge for the Analog and Mixed-Signal Testing” Jean-Louis Carbonero(1), Martine Dufils(1), Rohit Kapur(2), Shao-Hui Lee(3), Philippe Planelle(1), Jose Santiago(4), and Tony Taylor(5) (1) STMicroelectronics, France, (2) Synopsys, USA (3) ASE, Taiwan, (4) Philips, USA, (5) STILConsulting, USA
5:00pm - 5:30pm	“An On-Line Reconfiguration Scheme for an OFDM Wireless Front-End” Rajarajan Senguttuvan, Soumendu Bhattacharya, and Abhijit Chatterjee, Georgia Institute of Technology, USA

For more information, visit us on the web at: http://www.wtw2006.tec.ufl.edu/

The 5th IEEE Workshop on Test of Wireless Circuits and Systems (WTW 2006) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).